Published 1992 | Version v1
Book

Extended scaling of cross-sections for the ionization of H, H2 and He by multiply charged ions

  • 1. University of Osaka Prefecture, Osaka (Japan). Research Inst. for Advanced Science and Technology
  • 2. Japan Atomic Energy Research Inst., Tokai, Ibaraki (Japan). Tokai Research Establishment
  • 3. Oak Ridge National Lab., TN (United States)

Description

An analytic cross-section formula is given for the impact ionization of H, H2 and He by multiply charged ions. The formula is expressed as a modified Bethe cross-section for ionization by protons, multiplied by the square of the ionic charge and an analytic scaling factor. This scaling factor behaves as Eν at low energies, where E represents the projectile energy and ν is approximately equal to 0.9. The values of adjustable parameters in the formula were determined by least squares fits to the experimental data collected from the literature. The lowest projectile energy of the available data is 6 keV/amu and the root mean square deviation of all data from the analytic formula is 21%. (author). 19 refs, 2 figs, 3 tabs

Part of:
Atomic and plasma-material interaction data for fusion. V. 2

Additional details

Publishing Information

Publisher
IAEA.
Imprint Place
Vienna (Austria)
Imprint Title
Atomic and plasma-material interaction data for fusion. V. 2
Imprint Pagination
133 p.
Journal Issue
Suppl
Series
Nucl. Fusion.
Journal Page Range
p. 91-94.

INIS

Country of Publication
Austria
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
23077377
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
COLD PLASMA; CROSS SECTIONS; EVALUATED DATA; HELIUM; HYDROGEN; IONIZATION; MAGNETIC CONFINEMENT; MULTICHARGED IONS; REGRESSION ANALYSIS
Descriptors DEC
CHARGED PARTICLES; CONFINEMENT; DATA; ELEMENTS; INFORMATION; IONS; MATHEMATICS; NONMETALS; NUMERICAL DATA; PLASMA; PLASMA CONFINEMENT; RARE GASES; STATISTICS

Optional Information