Published September 2006
| Version v1
Journal article
An investigation of positron states and defects in Si irradiated with protons
Creators
- 1. GNTs RF Inst. Teoreticheskoj i Ehksperimental'noj Fiziki im. A.I. Alikhanova, Moscow (Russian Federation)
- 2. Moskovskij Gosudarstvennyj Inst. Ehlektronnoj Tekhniki (Tekhnicheskij Univ.), Zelenograd (Russian Federation)
Description
By means of analysis of experimental curves of angular distribution of annihilation of photons (ADAP) for initial and proton irradiated Si specimens as well as by the solution of kinetic equations of formation and annihilation of positron states the concentration of radiation defects in Si has been determined taking into account the partition of ADAP curve intensity into parabolic and Gaussian components
Abstract (Russian)
Методом анализа экспериментальных кривых углового распределения аннигиляционных фотонов (УРАФ) для необлученных и облученных протонами образцов кремния и путем решения кинетических уравнений образования и аннигиляции позитронных состояний по значениям интенсивности параболической и гауссовой компонент кривых УРАФ определены концентрации радиационных дефектов в кремнииAdditional details
Additional titles
- Original title (Russian)
- Исследование позитронных состояний и дефектов в кремнии, облученном протонами
Publishing Information
- Journal Title
- Fizika i Khimiya Obrabotki Materialov
- Journal Issue
- no.5
- Journal Page Range
- p. 5-12
- ISSN
- 0015-3214
- CODEN
- FKOMAT
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 38056018
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANGULAR DISTRIBUTION; ANNIHILATION; CRYSTAL DEFECTS; DOPPLER BROADENING; KINETIC EQUATIONS; MEV RANGE 01-10; MONOCRYSTALS; PHOTONS; PHYSICAL RADIATION EFFECTS; POSITRONS; PROTONS; SILICON
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; BARYONS; BOSONS; CRYSTAL STRUCTURE; CRYSTALS; DISTRIBUTION; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; EQUATIONS; FERMIONS; HADRONS; INTERACTIONS; LEPTONS; LINE BROADENING; MASSLESS PARTICLES; MATTER; MEV RANGE; NUCLEONS; PARTICLE INTERACTIONS; RADIATION EFFECTS; SEMIMETALS
Optional Information
- Notes
- 38 refs., 6 figs., 3 tabs.