Published June 1, 2010 | Version v1
Journal article Metadata-only

H2S-sensing properties of Pt-doped mesoporous indium oxide

Creators

  • 1. College of Material and Chemical Engineering, Ministry of Education Key Laboratory of Application Technology of Hainan Superior Resources Chemical Materials, Hainan University, Haikou 570228 (China)
  • 2. School of Material Science and Engineering, Key Laboratory of Automobile Materials of Ministry of Education, Jilin University, Changchun 130012 (China)
  • 3. Department of Chemistry and State Key Laboratory of Inorganic Synthesis and Preparative Chemistry, Jilin University, Changchun 130012 (China)

Description

Pt-doped mesoporous indium oxide (In2O3) has been successfully obtained by a simple and effective in situ nanocasting method. The resultant samples were characterized by XRD, FE-SEM, TEM, N2 physisorption, XPS and EDX. The gas sensing properties for hydrogen sulfide (H2S) of the Pt-doped mesoporous In2O3 specimens were also examined. The results exhibit those In2O3 specimens possess much higher response to H2S even at low concentration of 2 ppm and a lower optimum working temperature of 150 deg. C. A possible mechanism was also provided to explain the improvement of the sensing properties.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2010.03.055

Additional details

Identifiers

DOI
10.1016/j.apsusc.2010.03.055;
PII
S0169-4332(10)00346-6;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
256
Journal Issue
16
Journal Page Range
p. 5051-5055
ISSN
0169-4332
CODEN
ASUSEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44018195
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
DOPED MATERIALS; HYDROGEN; HYDROGEN SULFIDES; INDIUM OXIDES; NANOSTRUCTURES; PLATINUM ADDITIONS; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; SENSORS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
Descriptors DEC
CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; HYDROGEN COMPOUNDS; INDIUM COMPOUNDS; MATERIALS; MICROSCOPY; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SCATTERING; SPECTROSCOPY; SULFIDES; SULFUR COMPOUNDS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.