Published June 2009 | Version v1
Journal article

Determination of band offsets and subband levels for a GaInP/AlGaInP quantum well by photoreflectance using a InGaP laser diode

  • 1. Osaka Electro-Communication University, Neyagawa (Japan)
  • 2. Renesas Design Corp., Itami (Japan)

Description

The band offsets and subband levels in a double quantum well layer for a 660 nm-Ga0.4In0.6P/(Al0.5Ga0.5)0.5In0.5P quantum well laser are determined by photoreflectance using a 410 nm InGaN laser with current modulation at room temperature. The subband levels are analyzed by numerical calculation of the Schroedinger equation for the layer structure by varying the conduction band offset and compared with the measured photoreflectance spectra. The conduction band offset ratio is determined to be 0.5+0.03. (copyright 2009 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1002/pssc.200881540

Additional details

Identifiers

Publishing Information

Journal Title
Physica Status Solidi. C, Current Topics in Solid State Physics (Print)
Journal Volume
6
Journal Issue
6
Journal Page Range
p. 1517-1519
ISSN
1862-6351

Conference

Title
35. International symposium on compound semiconductors (ISCS 2008)
Dates
21-24 Sep 2008
Place
Rust (Germany)

Optional Information

Notes
With 4 figs., 2 tabs., 9 refs.; SICI: 1862-6351(200906)6:6<1517::AID-PSSC200881540>3.0.TX;2-L