Published July 1984 | Version v1
Journal article

Scanning electron microscopic studies of etched channels

Creators

  • 1. Pakistan Inst. of Nuclear Science and Technology, Rawalpindi. Nuclear Engineering Div.

Description

Scanning Electron Microscopic (SEM) studies of etched channels in the commonly available Solid State Nuclear Track Detectors (SSNTD) have been made. It has been observed that with the increase of the effective charge of the incident charged particle, (a) the cone angle is decreased, and (b) the track etching velocity and the track registration efficiency are increased. The results are expected to be helpful in understanding the inner structure of the etched channels. (author)

Additional details

Publishing Information

Journal Title
Int. J. Appl. Radiat. Isot.
Journal Volume
35
Journal Issue
7
Series
Int. J. Appl. Radiat. Isot.
Journal Page Range
611-615
ISSN
0020-708X