Published 2019
| Version v1
Book
Determination of boron concentration in in-house graphite reference material by instrumental charged particle activation analysis
Creators
- 1. Analytical Chemistry Division, Bhabha Atomic Research Centre, Variable Energy Cyclotron Centre, Bidhannagar, Kolkata (India)
- 2. Analytical Chemistry Division, Bhabha Atomic Research Centre, Mumbai (India)
Description
Graphite is extensively used in nuclear industry. An important parameter that decides the acceptability of graphite for nuclear applications is its boron (B) content. Analytical methods of high reliability are essential for determination of B in graphite at ppm to sub ppm levels. Due to the unavailability of graphite reference material (GRM), an In-house GRM for B has been prepared at Analytical Chemistry Division, Bhabha Atomic Research Centre, Mumbai and analyzed in this work by Charged Particle Activation Analysis (CPAA). This GRM can further be used as quality control (QC) material during quantification of B in unknown samples, validation of existing or development of new methodologies
Additional details
Publishing Information
- Publisher
- Bhabha Atomic Research Centre
- Imprint Place
- Mumbai (India)
- Imprint Title
- Proceedings of the fifteenth international conference on modern trends in activation analysis: book of abstract
- Imprint Pagination
- 234 p.
- Journal Page Range
- p. 26
Conference
- Title
- 15. international conference on modern trends in activation analysis
- Acronym
- MTAA-15
- Dates
- 17-22 Nov 2019
- Place
- Mumbai (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 51098345
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BORON 10; CONCENTRATION RATIO; GAMMA SPECTROSCOPY; GRAPHITE; HIGH-PURITY GE DETECTORS; NEUTRON ACTIVATION ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS
- Descriptors DEC
- ACTIVATION ANALYSIS; BORON ISOTOPES; CARBON; CHEMICAL ANALYSIS; DIMENSIONLESS NUMBERS; ELEMENTS; GE SEMICONDUCTOR DETECTORS; ISOTOPES; LIGHT NUCLEI; MEASURING INSTRUMENTS; MINERALS; NONDESTRUCTIVE ANALYSIS; NONMETALS; NUCLEI; ODD-ODD NUCLEI; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTROSCOPY; STABLE ISOTOPES