Published 1994 | Version v1
Book Metadata-only

Burnout sensitivity of power MOSFETs operating in a switching converter

Creators

  • 1. Centre National d'Etudes Spatiales (CNES), 31 - Toulouse (France)
  • 2. EREMS, 31 - Flourens (France)

Description

Heavy ion tests of a switching converter using power MOSFETs have allowed us to identify the main parameters which affect the burnout sensitivity of these components. The differences between static and dynamic conditions are clarified in this paper. (author). 7 refs., 16 figs., 3 tabs

Part of:
Radiation and its effects on components and systems

Additional details

Publishing Information

Publisher
Commissariat a l'Energie Atomique.
Imprint Place
Bruyeres-le-Chatel (France)
Imprint Title
Radiation and its effects on components and systems
Imprint Pagination
596 p.
Journal Page Range
p. 452-457.

Conference

Title
2. European Conference on Radiation and its Effects on Components and Systems.
Dates
13-16 Sep 1993.
Place
Saint-Malo (France).

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
27008816
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
BROMINE; BURNOUT; CARRIER LIFETIME; EXPERIMENTAL DATA; FREQUENCY DEPENDENCE; GANIL CYCLOTRON; HEAVY IONS; LET; LOSSES; MOSFET; NICKEL; PHYSICAL RADIATION EFFECTS; SPACE DEPENDENCE; SPACECRAFT POWER SUPPLIES; TEMPERATURE DEPENDENCE; TRANSISTOR SWITCHING CIRCUITS; XENON
Descriptors DEC
ACCELERATORS; CHARGED PARTICLES; CYCLIC ACCELERATORS; CYCLOTRONS; DATA; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; ELEMENTS; ENERGY TRANSFER; EQUIPMENT; FIELD EFFECT TRANSISTORS; HALOGENS; HEAVY ION ACCELERATORS; INFORMATION; IONS; ISOCHRONOUS CYCLOTRONS; LIFETIME; METALS; MOS TRANSISTORS; NONMETALS; NUMERICAL DATA; POWER SUPPLIES; RADIATION EFFECTS; RARE GASES; SEMICONDUCTOR DEVICES; SWITCHING CIRCUITS; TRANSISTORS; TRANSITION ELEMENTS

Optional Information