Published March 1, 2013 | Version v1
Journal article

A developed model for the determination of the dielectric function for some absorbing thin films using pseudo-Urbach tail

  • 1. Department of Physics, Faculty of Science, University of Guilan, Namjoo Ave., P.O. Box: 41335-1914 Rasht (Iran, Islamic Republic of)

Description

The proposed model is presented to manipulate the dielectric functions of Tauc–Lorentz–Urbach (TLU) model for determining optical constants in some absorbing thin films within the energy range 1.5–3 eV. This approach is applicable for strong absorbing thin films that their transmittance decreases with increasing energy in the visible region. In the proposed approach, the exponential function (similar to Urbach tail) is added to the Tauc–Lorentz dielectric function for the energy ranges above energy gap. The presented model provided more accurate estimates of the optical constants in the above band gap region compared to Tauc–Lorentz–Urbach (TLU) or Tauc–Lorentz (TL) model for the investigated strong absorbing thin films. The accuracy of the proposed parametric dielectric function model is verified by the use of some literature data. Also, the validity and applicability of this model is confirmed by the results of the optimization process for retrieving of the optical constants and thickness of thin film by a single transmission spectrum. The results of this approach are in good agreement with the optical constants and thickness of literature data and our experimental data

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physb.2012.12.011

Additional details

Identifiers

DOI
10.1016/j.physb.2012.12.011;
PII
S0921-4526(12)01053-8;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
412
Journal Page Range
p. 4-11
ISSN
0921-4526
CODEN
PHYBE3

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45051718
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ACCURACY; DIELECTRIC MATERIALS; ENERGY GAP; EV RANGE; FUNCTIONS; SPECTRA; THICKNESS; THIN FILMS
Descriptors DEC
DIMENSIONS; ENERGY RANGE; FILMS; MATERIALS

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.