Published June 11, 2007
| Version v1
Journal article
Statistical method for thickness measurement of amorphous objects
Creators
- 1. EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp (Belgium)
Description
The authors propose a nondestructive method for the determination of the thickness of an amorphous sample. This method is based on the statistics of the phase of the electron exit wave function, which depend on the number of atoms traversed by the incident electron which itself is a function of the thickness of the object. The accuracy of this method has been checked numerically by the multislice method and compared with that based on the mean inner potential
Additional details
Identifiers
- DOI
- 10.1063/1.2749184;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 90
- Journal Issue
- 24
- Journal Page Range
- p. 241911-241911.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39001282
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S36: MATERIALS SCIENCE;
- Descriptors DEI
- AMORPHOUS STATE; ELECTRONS; NONDESTRUCTIVE TESTING; STATISTICS; THICKNESS; WAVE FUNCTIONS
- Descriptors DEC
- DIMENSIONS; ELEMENTARY PARTICLES; FERMIONS; FUNCTIONS; LEPTONS; MATERIALS TESTING; MATHEMATICS; TESTING
Optional Information
- Notes
- (c) 2007 American Institute of Physics