Development of Compton X-ray spectrometer for high energy resolution single-shot high-flux hard X-ray spectroscopy
Creators
- 1. Institute of Laser Engineering, Osaka University, 2-6 Yamada-oka, Suita, Osaka 565-0871 (Japan)
- 2. National Institute for Fusion Science, 322-6 Oroshi, Toki, Gifu 509-5292 (Japan)
- 3. Laboratory of Advanced Science and Technology for Industry, University of Hyogo, 3-1-2 Kouto, Kamigori-cho, Ako-gun, Hyogo 678-1205 (Japan)
Description
Hard X-ray spectroscopy is an essential diagnostics used to understand physical processes that take place in high energy density plasmas produced by intense laser-plasma interactions. A bundle of hard X-ray detectors, of which the responses have different energy thresholds, is used as a conventional single-shot spectrometer for high-flux (>1013 photons/shot) hard X-rays. However, high energy resolution (Δhv/hv < 0.1) is not achievable with a differential energy threshold (DET) X-ray spectrometer because its energy resolution is limited by energy differences between the response thresholds. Experimental demonstration of a Compton X-ray spectrometer has already been performed for obtaining higher energy resolution than that of DET spectrometers. In this paper, we describe design details of the Compton X-ray spectrometer, especially dependence of energy resolution and absolute response on photon-electron converter design and its background reduction scheme, and also its application to the laser-plasma interaction experiment. The developed spectrometer was used for spectroscopy of bremsstrahlung X-rays generated by intense laser-plasma interactions using a 200 μm thickness SiO2 converter. The X-ray spectrum obtained with the Compton X-ray spectrometer is consistent with that obtained with a DET X-ray spectrometer, furthermore higher certainly of a spectral intensity is obtained with the Compton X-ray spectrometer than that with the DET X-ray spectrometer in the photon energy range above 5 MeV.
Additional details
Identifiers
- DOI
- 10.1063/1.4944864;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 87
- Journal Issue
- 4
- Journal Page Range
- p. 043502-043502.10
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48041753
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BREMSSTRAHLUNG; COMPTON EFFECT; ELECTRONS; ENERGY DENSITY; ENERGY RESOLUTION; HARD X RADIATION; INTERACTIONS; LASERS; MEV RANGE 01-10; PHOTONS; PLASMA DENSITY; SILICA; SILICON OXIDES; THICKNESS; X-RAY SPECTRA; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY
- Descriptors DEC
- BASIC INTERACTIONS; BOSONS; CHALCOGENIDES; DIMENSIONS; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; INTERACTIONS; IONIZING RADIATIONS; LEPTONS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; MEV RANGE; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; RESOLUTION; SCATTERING; SILICON COMPOUNDS; SPECTRA; SPECTROMETERS; SPECTROSCOPY; X RADIATION
Optional Information
- Notes
- (c) 2016 AIP Publishing LLC