Effect of ammonia plasma treatment on graphene oxide LB monolayers
Creators
- 1. Department of Physics, Indian Institute of Technology Bombay, Mumbai - 400076 (India)
- 2. Department of Metallurgical Engineering and Materials Science, Indian Institute of Technology Bombay, Mumbai - 400076 (India)
Description
Graphene oxide monolayer sheets were transferred on Si and SiO2/Si substrates by Langmuir-Blodgett technique and were exposed to ammonia plasma at room temperature. The monolayer character of both graphene oxide and plasma treated graphene oxide sheets were ascertained by atomic force microscopy. X-ray photoelectron spectroscopy and Raman spectroscopy revealed that ammonia plasma treatment results in enhancement of graphitic carbon content along with the incorporation of nitrogen. The conductivity of graphene oxide monolayers, which was in the range of 10−6-10−7 S/cm, increased to 10−2-10−3 S/cm after the ammonia plasma treatment. These results indicate that the graphene oxide was simultaneously reduced and N-doped during ammonia plasma treatment, without affecting the morphological stability of sheets.
Additional details
Identifiers
- DOI
- 10.1063/1.4791231;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1512
- Journal Issue
- 1
- Journal Page Range
- p. 702-703
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 57. DAE solid state physics symposium 2012
- Dates
- 3-7 Dec 2012
- Place
- Mumbai (India)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44072675
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMMONIA; ATOMIC FORCE MICROSCOPY; DOPED MATERIALS; GRAPHENE; GRAPHITE; NITROGEN; PHASE STABILITY; PLASMA; RAMAN SPECTRA; RAMAN SPECTROSCOPY; SILICON; SILICON OXIDES; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CARBON; CHALCOGENIDES; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; HYDRIDES; HYDROGEN COMPOUNDS; LASER SPECTROSCOPY; MATERIALS; MICROSCOPY; MINERALS; NITROGEN COMPOUNDS; NITROGEN HYDRIDES; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SEMIMETALS; SILICON COMPOUNDS; SPECTRA; SPECTROSCOPY; STABILITY; TEMPERATURE RANGE
Optional Information
- Notes
- (c) 2013 American Institute of Physics