Thermo-mechanical characterization of surface-micromachined microheaters using in-line digital holography
Creators
- 1. Department of Electrical Communication Engineering and Centre of Excellence in Nanoelectronics, Indian Institute of Science, Bangalore-560012 (India)
- 2. School of Mechanical and Aerospace Engineering, Nanyang Technological University, Singapore-639798 (Singapore)
- 3. Department of Aerospace Engineering, Indian Institute of Science, Bangalore-560012 (India)
Description
This paper describes the application of lensless in-line digital holographic microscopy (DHM) to carry out thermo-mechanical characterization of microheaters fabricated through PolyMUMPs three-layer polysilicon surface micromachining process and subjected to a high thermal load. The mechanical deformation of the microheaters on the electrothermal excitation due to thermal stress is analyzed. The numerically reconstructed holographic images of the microheaters clearly indicate the regions under high stress. A double-exposure method has been used to obtain the quantitative measurements of the deformations, from the phase analysis of the hologram fringes. The measured deformations correlate well with the theoretical values predicted by a thermo-mechanical analytical model. The results show that lensless in-line DHM with Fourier analysis is an effective method for evaluating the thermo-mechanical characteristics of MEMS components
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/21/1/015301Additional details
Identifiers
- DOI
- 10.1088/0957-0233/21/1/015301;
- PII
- S0957-0233(10)21300-0;
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 21
- Journal Issue
- 1
- Journal Page Range
- [10 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45005484
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DEFORMATION; EXCITATION; FOURIER ANALYSIS; HOLOGRAPHY; IMAGES; MICROSCOPY; MICROSTRUCTURE; PHASE STUDIES; SURFACES; THERMAL STRESSES
- Descriptors DEC
- ENERGY-LEVEL TRANSITIONS; STRESSES