Published January 2010 | Version v1
Journal article

Thermo-mechanical characterization of surface-micromachined microheaters using in-line digital holography

  • 1. Department of Electrical Communication Engineering and Centre of Excellence in Nanoelectronics, Indian Institute of Science, Bangalore-560012 (India)
  • 2. School of Mechanical and Aerospace Engineering, Nanyang Technological University, Singapore-639798 (Singapore)
  • 3. Department of Aerospace Engineering, Indian Institute of Science, Bangalore-560012 (India)

Description

This paper describes the application of lensless in-line digital holographic microscopy (DHM) to carry out thermo-mechanical characterization of microheaters fabricated through PolyMUMPs three-layer polysilicon surface micromachining process and subjected to a high thermal load. The mechanical deformation of the microheaters on the electrothermal excitation due to thermal stress is analyzed. The numerically reconstructed holographic images of the microheaters clearly indicate the regions under high stress. A double-exposure method has been used to obtain the quantitative measurements of the deformations, from the phase analysis of the hologram fringes. The measured deformations correlate well with the theoretical values predicted by a thermo-mechanical analytical model. The results show that lensless in-line DHM with Fourier analysis is an effective method for evaluating the thermo-mechanical characteristics of MEMS components

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/21/1/015301

Additional details

Identifiers

DOI
10.1088/0957-0233/21/1/015301;
PII
S0957-0233(10)21300-0;

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
21
Journal Issue
1
Journal Page Range
[10 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45005484
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
DEFORMATION; EXCITATION; FOURIER ANALYSIS; HOLOGRAPHY; IMAGES; MICROSCOPY; MICROSTRUCTURE; PHASE STUDIES; SURFACES; THERMAL STRESSES
Descriptors DEC
ENERGY-LEVEL TRANSITIONS; STRESSES