Published December 1998
| Version v1
Journal article
Anatomy of an in-flight anomaly: Investigation of proton-induced SEE test results for stacked IBM DRAMs
Creators
- 1. NASA/Goddard Space Flight Center, Greenbelt, MD (United States)
- 2. Marshall (P.W.), Brookneal, VA (United States)
- 3. Jackson and Tull Chartered Engineers, Seabrook, MD (United States)
- 4. NRL, Washington, DC (United States)
Description
The authors present ground test and space flight data describing a single event anomaly that affects multiple bytes in a stacked DRAM module. A 12 Gbit solid state recorder containing 1,440 DRAM die experiences the anomalous events at a rate requiring testing of a large sample set of these modules
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 45
- Journal Issue
- 6Pt1
- Journal Page Range
- p. 2898-2903
- ISSN
- 0018-9499
- CODEN
- IETNAE
Conference
- Title
- IEEE nuclear and space radiation effects conference
- Dates
- 20-24 Jul 1998
- Place
- Newport Beach, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30034852
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ERRORS; LET; MEMORY DEVICES; PHYSICAL RADIATION EFFECTS; RECORDING SYSTEMS; SPACE FLIGHT
- Descriptors DEC
- ENERGY TRANSFER; RADIATION EFFECTS
Optional Information
- Secondary number(s)
- CONF-980705--