Published May 1984 | Version v1
Journal article Metadata-only

Resonance Raman spectra of porphyrins on gamma-alumina and silica

Creators

  • 1. Department of Chemical Engineering, Ames Laboratory-USDOE, Iowa State University, Ames, Iowa, 50011 (G.L.S)
  • 2. Center for Catalytic Science and Technology, University of Delaware, Newark, Delaware 19711 (B.J.S.)

Description

Resonance Raman Spectroscopy is used to evaluate trace contaminants of nickel and vanadiuim prophysins on gamma-alumina. Nickel tetraphenyl-porphine compounds were adsorbed on gamma-alumina and silica and Raman spectra were obtained by excitation into the visible porphyrin bands

Additional details

Publishing Information

Journal Title
Appl. Spectrosc.
Journal Volume
38
Journal Issue
3
Series
Appl. Spectrosc.
Journal Page Range
433-435
ISSN
0003-7028

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
16020279
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
ADSORPTION; ALUMINIUM OXIDES; CHEMICAL REACTION KINETICS; LASER SPECTROSCOPY; NICKEL COMPOUNDS; PORPHYRINS; QUANTITATIVE CHEMICAL ANALYSIS; RAMAN SPECTRA; SILICON OXIDES; TRACE AMOUNTS; VANADIUM COMPOUNDS
Descriptors DEC
ALUMINIUM COMPOUNDS; CARBOXYLIC ACIDS; CHALCOGENIDES; CHEMICAL ANALYSIS; HETEROCYCLIC ACIDS; HETEROCYCLIC COMPOUNDS; KINETICS; ORGANIC ACIDS; ORGANIC COMPOUNDS; ORGANIC NITROGEN COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; REACTION KINETICS; SILICON COMPOUNDS; SPECTRA; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS