Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS)
- 1. University of Antwerp, Department of Chemistry, B-2610 Wilrijk (Belgium)
- 2. Agfa-Gevaert N.V., B-2640 Mortsel (Belgium)
Description
Metal-assisted (MetA) SIMS using the deposition of a thin Au or Ag layer on non-conducting samples prior to analysis has been advocated as a means to improve the secondary ion (S.I.) yields of organic analytes. This study focuses on the influence of time and temperature on the yield enhancement in MetA-SIMS using thick layers of poly(vinylbutyral-co-vinylalcohol-co-vinylacetate) (PVB) containing dihydroxybenzophenone (DHBPh) or a cationic carbocyanine dye (CBC) and spin-coated layers of the cationic dye on Si. Pristine samples as well as Au- and Ag-coated ones were kept between -8 deg. C and 80 deg. C and analysed with S-SIMS at intervals of a few days over a period of 1 month. The yield enhancement was found to depend strongly on the kind of evaporated metal, the storage temperature and time between coating and analysis
Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2006.02.110;
- PII
- S0169-4332(06)00408-9;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 252
- Journal Issue
- 19
- Journal Page Range
- p. 6652-6655
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 15. International conference on secondary ion mass spectrometry
- Acronym
- SIMS XV
- Dates
- 12-16 Oct 2005
- Place
- Manchester (United Kingdom)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38104131
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DEPOSITION; GOLD; ION MICROPROBE ANALYSIS; LAYERS; MASS SPECTROSCOPY; ORGANIC COMPOUNDS; SILVER; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- CHEMICAL ANALYSIS; ELEMENTS; METALS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; SPECTROSCOPY; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.