Published July 30, 2006 | Version v1
Journal article

Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS)

  • 1. University of Antwerp, Department of Chemistry, B-2610 Wilrijk (Belgium)
  • 2. Agfa-Gevaert N.V., B-2640 Mortsel (Belgium)

Description

Metal-assisted (MetA) SIMS using the deposition of a thin Au or Ag layer on non-conducting samples prior to analysis has been advocated as a means to improve the secondary ion (S.I.) yields of organic analytes. This study focuses on the influence of time and temperature on the yield enhancement in MetA-SIMS using thick layers of poly(vinylbutyral-co-vinylalcohol-co-vinylacetate) (PVB) containing dihydroxybenzophenone (DHBPh) or a cationic carbocyanine dye (CBC) and spin-coated layers of the cationic dye on Si. Pristine samples as well as Au- and Ag-coated ones were kept between -8 deg. C and 80 deg. C and analysed with S-SIMS at intervals of a few days over a period of 1 month. The yield enhancement was found to depend strongly on the kind of evaporated metal, the storage temperature and time between coating and analysis

Additional details

Identifiers

DOI
10.1016/j.apsusc.2006.02.110;
PII
S0169-4332(06)00408-9;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
252
Journal Issue
19
Journal Page Range
p. 6652-6655
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
15. International conference on secondary ion mass spectrometry
Acronym
SIMS XV
Dates
12-16 Oct 2005
Place
Manchester (United Kingdom)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38104131
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DEPOSITION; GOLD; ION MICROPROBE ANALYSIS; LAYERS; MASS SPECTROSCOPY; ORGANIC COMPOUNDS; SILVER; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0273-0400 K
Descriptors DEC
CHEMICAL ANALYSIS; ELEMENTS; METALS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; SPECTROSCOPY; TEMPERATURE RANGE; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.