Published November 30, 2006 | Version v1
Journal article

Formation and Shape Transition of Nanostructures on Si(100) surfaces after MeV Sb Implantation

  • 1. Institute of Physics, Sachivalaya Marg, Bhubaneswar 751005 (India)
  • 2. IUC-DAEF, University Campus, Khandwa Road, Indore (India)

Description

We have studied the formation of nanostructures on Si(100) surfaces after 1.5-bar MeV Sb implantation. Scanning Probe Microscopy has been utilized to investigate the ion implanted surfaces. We observe the formation of nanostructures after a fluence of 1x1013-bar ions/cm2. These surface structures are elliptical in shape with an eccentricity of 0.86 and their major and minor axes having dimensions of about 11.6-bar nm and 23.0-bar nm, respectively. The area of the nanostructure is 210-bar nm2at this fluence. Although the nanostructures remain of elliptical shape, their area increase with increasing fluence. However, after a fluence of 5x1014-bar ions/cm2 a transition in shape of nanostructures is observed. Nanostructures become approximately circular with an eccentricity of 0.19 and a diameter of about 30.1-bar nm. At this fluence we also observe a large increase in the area of the nanostructures to 726-bar nm2. Surface morphology and surface roughness of the ion implanted surfaces has also been discussed

Additional details

Identifiers

DOI
10.1016/j.apsusc.2006.01.049;
arXiv
arXiv:cond-mat/0504225v1;
PII
S0169-4332(06)00116-4;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
253
Journal Issue
3
Journal Page Range
p. 1116-1121
ISSN
0169-4332
CODEN
ASUSEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38106168
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANTIMONY; ATOMIC FORCE MICROSCOPY; ION IMPLANTATION; IONS; MEV RANGE 01-10; NANOSTRUCTURES; SILICON; SURFACES
Descriptors DEC
CHARGED PARTICLES; ELEMENTS; ENERGY RANGE; METALS; MEV RANGE; MICROSCOPY; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.