Enhancement of diffusion-induced grain boundary migration by ion irradiation
Creators
- 1. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Description
Diffusion-induced grain boundary migration (DIGM) was observed in Au/Cu bilayers irradiated with 1.5 MeV Kr at T≥400 K. Rutherford backscattering spectrometry (RBS) showed nearly uniform distributions of Cu present throughout polycrystalline Au films after irradiation and after annealing treatments. Irradiation increased the amount of Cu relative to annealed-only areas. Cross-section transmission electron microscopy combined with x-ray energy dispersive spectroscopy (XEDS) identified alloyed zones (14--20 at. % Cu), confirming DIGM in the Au film of an ion bombarded bilayer. A description of DIGM is presented relating RBS measurements of the film-averaged Cu composition with treatment time, average grain size, and film thickness. Application of this model to the experimental results in combination with XEDS work indicates that irradiation enhances DIGM by increasing the grain boundary velocity
Additional details
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 62
- Journal Issue
- 14
- Journal Page Range
- p. 1597-1599.
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24049312
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHEMICAL COMPOSITION; COPPER; DIFFUSION; FILMS; GOLD; GRAIN BOUNDARIES; INTERFACES; ION BEAMS; MICROSTRUCTURE; PHYSICAL RADIATION EFFECTS; POLYCRYSTALS; RUTHERFORD SCATTERING; TRANSMISSION ELECTRON MICROSCO
- Descriptors DEC
- BEAMS; CRYSTAL STRUCTURE; CRYSTALS; ELASTIC SCATTERING; ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; RADIATION EFFECTS; SCATTERING; TRANSITION ELEMENTS