Published September 1975 | Version v1
Journal article

Beam focusing by aperture displacement in multiampere ion sources

  • 1. Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830

Description

Results are given of an experimental study of beam focusing by aperture displacement (Δx) in duoPIGatron ion sources. Measurements with a single aperture, accel--decel electrode geometry show that the beam deflection angle is linear with Δx/z for the round aperture and with Δx/z*2 for the slit aperture, where z and z* are, respectively, the extraction gap distance and the effective gap distance. Applying the result of the single aperture study to the multiaperture duoPIGatron sources, it was possible to increase the neutral beam injection power to the Oak Ridge Tokamak (ORMAK) plasma by approx. =40%. Also presented are a discussion and comparison of other work on the effect of aperture displacement on beam deflection. (auth)

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
46
Journal Issue
9
Series
Rev. Sci. Instrum.
Journal Page Range
1193-1196
ISSN
0034-6748

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
7225953
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Descriptors DEI
AMP BEAM CURRENTS; APERTURES; BEAM INJECTION; BEAM OPTICS; EFFICIENCY; ION SOURCES
Descriptors DEC
BEAM CURRENTS; CURRENTS; OPENINGS

Optional Information

Notes
Updated automatically by Metadata and Full-Text Enrichment Agent