Published August 2015
| Version v1
Journal article
Nanostructures and pinholes on W surfaces exposed to high flux D plasma at high temperatures
- 1. Laboratory of Advanced Materials, School of Materials Science and Engineering, Tsinghua University, Beijing 100084 (China)
- 2. Institute of Plasma Physics, Chinese Academy of Sciences, Hefei, Anhui 230031 (China)
- 3. ITER Organization, Route de Vinon-Sur-Verdon, CS 90 046, 13067 St Paul Lez Durance Cedex (France)
- 4. FOM Institute DIFFER-Dutch Institute for Fundamental Energy Research, Edisonbaan 14, 3439 MN Nieuwegein (Netherlands)
Description
Nanostructures and pinholes formed on tungsten surface exposed to high fluxes (1024 m−2 s−1) deuterium ions at 943 K and 1073 K were studied by scanning electron microscopy and electron backscatter diffraction. Nanostructure formation is observed at 943 K and 1073 K, and exhibits a strong dependence on the surface orientation. With increasing fluence, pinholes appear on the surface and are mainly observed on grains with surface normal near [1 1 1]. The pinholes are speculated to be caused by the rupture of bubbles formed near the surface. The formation of pinholes has no obvious relationship with the surface nanostructures
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jnucmat.2014.11.054Additional details
Identifiers
- DOI
- 10.1016/j.jnucmat.2014.11.054;
- PII
- S0022-3115(14)00845-9;
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 463
- Journal Page Range
- p. 312-315
- ISSN
- 0022-3115
- CODEN
- JNUMAM
Conference
- Title
- 21. international conference on plasma-surface interactions in controlled fusion devices
- Acronym
- Plasma-Surface Interactions 21
- Dates
- 26-30 May 2014
- Place
- Kanazawa (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47027211
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BACKSCATTERING; BUBBLES; DEUTERIUM IONS; ELECTRON DIFFRACTION; NANOSTRUCTURES; ORIENTATION; PLASMA; RUPTURES; SCANNING ELECTRON MICROSCOPY; SURFACES; TEMPERATURE RANGE 0400-1000 K; TEMPERATURE RANGE 1000-4000 K; TUNGSTEN
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; FAILURES; IONS; METALS; MICROSCOPY; REFRACTORY METALS; SCATTERING; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.