Core-level XPS spectra of fullerene, highly oriented pyrolitic graphite, and glassy carbon
Creators
Description
The C 1s spectra of fullerene C60, highly oriented pyrolitic graphite (HOPG) and amorphous carbon (a-C) have been measured using X-ray photoemission. The assumed background due to the inelastic scattering of electrons of these spectra has been subtracted by the Tougaard's method. The relative intensities and the energy positions for the core-level satellites have been determined. For C60, a comparison of the low energy π type shake-up satellites gives good agreement between theory and experiment. Also, the energies of these features for fullerene and glassy carbon are very similar, whereas the corresponding energies for HOPG are somewhat larger, presumably, because of the higher density of the latter. Moreover, the atomic force microscopy (AFM) study indicates that the C60 samples consist of a thick layer of large clusters on the Si(111) surface, which is in line with the molecular character of the XPS spectrum. Furthermore, the broad high energy satellite does not consist of a single plasmon but of many components due to collective excitations characteristic of molecules and solids. These features are discussed in the light of theoretical excitation energies
Additional details
Identifiers
- PII
- S0368204802002840;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 128
- Journal Issue
- 2-3
- Journal Page Range
- p. 205-213
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34032002
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMORPHOUS STATE; ATOMIC FORCE MICROSCOPY; COLLECTIVE EXCITATIONS; ELECTRONIC STRUCTURE; FULLERENES; GRAPHITE; MICROSTRUCTURE; PHOTOEMISSION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CARBON; ELECTRON SPECTROSCOPY; ELEMENTS; EMISSION; ENERGY-LEVEL TRANSITIONS; EXCITATION; MICROSCOPY; MINERALS; NONMETALS; PHOTOELECTRON SPECTROSCOPY; SECONDARY EMISSION; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.