Published June 2010
| Version v1
Journal article
Electronic structure of W-doped VO2 thin films with giant metal-insulator transition investigated by hard x-ray core-level photoemission spectroscopy
- 1. Osaka Univ., Inst. of Scientific and Industrial Research, Ibaraki, Osaka (Japan)
- 2. National Inst. for Material Science, NIMS Beamline Station SPring-8, Sayo, Hyogo (Japan)
Description
We use bulk-sensitive hard X-ray core-level photoemission spectroscopy to investigate the electronic structure of 1 at. % W-doped VO2 (VWO) thin films exhibiting a high temperature coefficient of resistance, above -10%/K at room temperature. According to the W 4d core-level spectra, the chemical state of doped W takes only a 6+ valence state, which suggests the introduction of V3+. The satellite structure of the V 2p3/2 main peak, which corresponds to the metallic-coherent screened states, was enhanced for VWO compared with VO2 indicating that electron doping plays an important role in the control of metal-insulator transition. (author)
Availability note (English)
Available from http://dx.doi.org/10.1143/APEX.3.063201Additional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics Express
- Journal Volume
- 3
- Journal Issue
- 6
- Journal Page Range
- p. 063201.1-063201.3
- ISSN
- 1882-0778
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 42034815
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CHEMICAL STATE; ELECTRIC CONDUCTIVITY; ELECTRICAL INSULATORS; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; HARD X RADIATION; PHOTOEMISSION; TEMPERATURE COEFFICIENT; TEMPERATURE DEPENDENCE; THIN FILMS; TUNGSTEN ADDITIONS; TUNGSTEN IONS; VALENCE; VANADIUM IONS; VANADIUM OXIDES; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; EMISSION; EQUIPMENT; FILMS; IONIZING RADIATIONS; IONS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; REACTIVITY COEFFICIENTS; SCATTERING; SECONDARY EMISSION; SPECTROSCOPY; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN ALLOYS; VANADIUM COMPOUNDS; X RADIATION
Optional Information
- Notes
- 19 refs., 3 figs.