Published March 2007
| Version v1
Journal article
Ferromagnetism of 3-D transition metals solid solutions in titanium oxides
Creators
- 1. Institute of Rare Metals, Moscow, 119017 (Russian Federation)
- 2. Department of Physics, Moscow State University, Moscow, 119992 (Russian Federation)
- 3. Department of Physics, Queen Mary University of London, London E1 4NS (United Kingdom)
Description
The structure and magnetic properties of the films of titanium oxides doped with magnetic impurities are investigated both in as-deposited state and after thermal treatments in vacuum. In the as-deposited films, ferromagnetism was shown to be caused by magnetic cluster formation during deposition. The vacuum quenching of Ti1-x Co x O2-δ films results in the partial transition of a magnetic impurity from clusters into a matrix. The low-temperature vacuum annealing leads to a rise of weak ferromagnetism in the semiconductor solid solution
Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2006.10.779;
- PII
- S0304-8853(06)01930-5;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 310
- Journal Issue
- 2
- Journal Page Range
- p. e714-e716
- ISSN
- 0304-8853
- CODEN
- JMMMDC
Conference
- Title
- 17. International Conference on Magnetism
- Dates
- 20-25 Aug 2006
- Place
- Kyoto (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39024854
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; COBALT COMPOUNDS; DEPOSITION; DOPED MATERIALS; FERROMAGNETISM; FILMS; MAGNETIC PROPERTIES; QUENCHING; SEMICONDUCTOR MATERIALS; SOLID SOLUTIONS; TITANIUM OXIDES; TRANSITION ELEMENTS
- Descriptors DEC
- CHALCOGENIDES; DISPERSIONS; ELEMENTS; HEAT TREATMENTS; HOMOGENEOUS MIXTURES; MAGNETISM; MATERIALS; METALS; MIXTURES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SOLUTIONS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.