Growth and characterization of rare earth doped mixed chaclogenide thin films

Cd_1-xGd_xSe (x = 0.01, 0.02) has been grown by using Chemical bath deposition technique. Structural, Morphological and Optical studies were performed using X-ray diffraction (XRD), Scanning Electron Microscopy (SEM), UV-Visible spectrometer, Photoluminescence spectrometer (PL). XRD patterns confirm the formation of polycrystalline nature with Cubic phase. Cd_1-xGd_xSe diffraction peaks was appeared slightly shifting on doping. The values of lattice parameter and particle size was calculated by high order peak, decrease on doping. Morphology confirms that size distribution of films is uniform. From EDAX studies it is found the Cd, Gd and Se ratio is close to showing that the material has been grown with excellent stoichiometry. (author)