Published January 27, 1975
| Version v1
Journal article
Negative charge storage in thermal SiO2 under electron irradiation
Creators
- 1. Centre National de la Recherche Scientifique, 31 - Toulouse (France). Lab. d'Automatique et d'Analyse des Systemes
Description
no abstract available
Additional details
Additional titles
- Original title (French)
- Stockage de charges negatives dans la silice thermique par irradiation electronique
Publishing Information
- Journal Title
- C. R., Ser. B
- Journal Volume
- 280
- Journal Issue
- 4
- Series
- C. R., Ser. B.
- Journal Page Range
- 69-71
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 6197239
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ELECTRIC CHARGES; ELECTRONS; MOS TRANSISTORS; PHYSICAL RADIATION EFFECTS; SILICON OXIDES
- Descriptors DEC
- CHALCOGENIDES; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; OXIDES; OXYGEN COMPOUNDS; RADIATION EFFECTS; SEMICONDUCTOR DEVICES; SILICON COMPOUNDS; TRANSISTORS