Morphology of superconducting FeSe thin films grown by MBE and RF-sputtering
Creators
- 1. Institut fuer Physik, Johannes Gutenberg Universitaet Mainz (Germany)
- 2. Leibniz-Institut fuer Festkoerper- und Werkstoffforschung, Dresden (Germany)
Description
Tunneling spectroscopy on planar junctions is the most direct approach for the investigation of superconducting coupling mechanisms. However, it requires smooth interfaces at the tunneling barrier. The morphology of superconducting thin films of FeSe grown by MBE and co-sputtering (RF) from an iron and a selenium target are compared. MBE deposited films show an extreme sensitivity to stoichiometry, deposition temperature and choice of substrate. These films exhibit macroscopic crevices and a pronounced roughness, rendering the preparation of tunneling junctions impossible. However, sputter deposited epitaxial FeSe thin films clearly show a more favorable morphology. Optical microscopy, AFM and SEM demonstrate a smooth surface with segregations which are eliminated by proper choice of the deposition parameters.
Additional details
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Regensburg 2013 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 48(3)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- DPG Spring meeting of the condensed matter section (SKM) together with the divisions microprobes, radiation and medical physics and working groups industry and business, young DPG
- Dates
- 10-15 Mar 2013
- Place
- Regensburg (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 46007061
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; DEPOSITION; IRON SELENIDES; MOLECULAR BEAM EPITAXY; MORPHOLOGY; OPTICAL MICROSCOPY; ROUGHNESS; SCANNING ELECTRON MICROSCOPY; SEGREGATION; SPUTTERING; SUPERCONDUCTING FILMS; SURFACES; THIN FILMS
- Descriptors DEC
- CHALCOGENIDES; CRYSTAL GROWTH METHODS; ELECTRON MICROSCOPY; EPITAXY; FILMS; IRON COMPOUNDS; MICROSCOPY; SELENIDES; SELENIUM COMPOUNDS; SURFACE PROPERTIES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- Session: TT 12.49 Mo 15:00; No further information available