Study on the mechanism of afterglow in CsI: Tl and the afterglow suppression in CsI: Tl, Eu
- 1. University of Electronic Science and Technology of China, Chengdu (China). School of Optoelectronic Science and Engineering
- 2. University of Electronic Science and Technology of China, Chengdu (China). School of Electronic Science and Engineering (National Exemplary School of Microelectronics)
Description
Although there are many new scintillators being developed recently, CsI: Tl is still a very efficient one among them. However it suffers from afterglow which limits application in high-speed x-ray imaging. In order to find out the mechanism of afterglow and the method to suppress afterglow in CsI: Tl, the theoretical model of perfect CsI, CsI: Tl and CsI: Tl, Eu are built by the software Material Studio. The total and partial density of states of these three models is calculated within the framework of generalized gradient approximation and ultra-soft pseudo-potential. The results indicate that the generation of afterglow in CsI: Tl is due to the impurity energy bands introduced by Tl. Moreover, co-doping CsI: Tl with Eu will introduce deeper impurity energy bands which can effectively scavenge the electrons trapped by the shallow impurity energy bands introduced by Tl, thus suppressing the afterglow in CsI: Tl. (author)
Additional details
Publishing Information
- Journal Title
- Journal of Radioanalytical and Nuclear Chemistry
- Journal Volume
- 320
- Journal Issue
- 1
- Journal Page Range
- p. 123-128
- ISSN
- 0236-5731
- CODEN
- JRNCDM
INIS
- Country of Publication
- Hungary
- Country of Input or Organization
- Hungary
- INIS RN
- 50045694
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AFTERGLOW; IMAGES; SCINTILLATION COUNTERS; THALLIUM IONS; X-RAY DETECTION
- Descriptors DEC
- CHARGED PARTICLES; DETECTION; IONS; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS
Optional Information
- Notes
- 10 refs.