Published October 15, 2009
| Version v1
Journal article
Response of nanocrystalline 3C silicon carbide to heavy-ion irradiation
Creators
- 1. Pacific Northwest National Laboratory, P.O. Box 999, Richland, Washington 99352 (United States)
- 2. Texas A and M University, College Station, Texas 77843 (United States)
- 3. State University of New York at Binghamton, P.O. Box 6000, Binghamton, New York 13902 (United States)
Description
Nanostructured materials are generally believed to be more radiation resistant. This study reports on Au-ion-induced amorphization in nanocrystalline 3C-SiC, characterized using x-ray diffraction, transmission electron microscopy and Raman spectroscopy. Full amorphization at room temperature occurs at a comparable dose to that for bulk SiC single crystals. The behavior is primarily attributed to a high ion flux and sluggish migration of point defects produced during irradiation. The results may have a significant implication of using nanophased SiC in extremely high radiation environments.
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 80
- Journal Issue
- 16
- Journal Page Range
- p. 161301-161301.4
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41035410
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMORPHOUS STATE; GOLD IONS; HEAVY IONS; ION BEAMS; IRRADIATION; MIGRATION; MONOCRYSTALS; NANOSTRUCTURES; PHYSICAL RADIATION EFFECTS; POINT DEFECTS; RADIATION HARDENING; RAMAN SPECTRA; RAMAN SPECTROSCOPY; SEMICONDUCTOR MATERIALS; SILICON CARBIDES; TEMPERATURE RANGE 0273-0400 K; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; CARBIDES; CARBON COMPOUNDS; CHARGED PARTICLES; COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELECTRON MICROSCOPY; HARDENING; IONS; LASER SPECTROSCOPY; MATERIALS; MICROSCOPY; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS; SCATTERING; SILICON COMPOUNDS; SPECTRA; SPECTROSCOPY; TEMPERATURE RANGE
Optional Information
- Notes
- (c) 2009 The American Physical Society