Characterization of impact materials around Barringer Meteor Crater by micro-PIXE and micro-SRXRF techniques

A combined micro-PIXE and micro-SRXRF method has been tested successfully for the characterization of impact materials collected at the well-known Barringer Meteor Crater. The micro-PIXE technique proved to be sensitive in the Z≤28 atomic number region while the micro-SRXRF above Fe especially for the siderophile elements. Quantitative analysis has become available for about 40 elements by these complementary methods providing new perspectives for the interpretation of the formation mechanism of impact metamorphosed objects