Absorption corrections and digital filtering of X-ray diffraction profiles recorded with a position-sensitive detector

Expressions for the absorption correction function are obtained in the form of integral equations for the case of a flat-plate sample and a position-sensitive detector. It is shown that the absorption correction used for both transmission and reflection geometries with a conventional diffractometer may be applied to a diffractometer equipped with a linear position-sensitive detector. The application of a Savitzky-Golay-type digital filter considerably facilitates the analysis of the data without losing pertinent information. (orig.)