Published December 1, 2005 | Version v1
Journal article

Plasma interferometry and how the bound-electron contribution can bend fringes in unexpected ways

Description

Utilizing a new average atom code, we calculate the index of refraction in C, Al, Ti, and Pd plasmas and show many conditions over which the bound-electron contribution dominates the free electrons as we explore photon energies from the optical to 100 eV (12 nm) soft x rays. For decades measurement of the electron density in plasmas by interferometers has relied on the approximation that the index of refraction in a plasma is due solely to the free electrons and therefore is less than 1. Recent measurements of Al plasmas using x-ray laser interferometers observed fringes bending in the opposite direction than expected due to the bound-electron contribution causing the index of refraction to be larger than 1. During the next decade x-ray free-electron lasers and other sources will be available to probe a wider variety of plasmas at higher densities and shorter wavelengths, so understanding the index of refraction in plasmas is essential

Additional details

Identifiers

Publishing Information

Journal Title
Applied Optics
Journal Volume
44
Journal Issue
34
Journal Page Range
p. 7295-7301
ISSN
0003-6935
CODEN
APOPAI

Optional Information

Notes
(c) 2005 Optical Society of America