Plasma interferometry and how the bound-electron contribution can bend fringes in unexpected ways
Creators
Description
Utilizing a new average atom code, we calculate the index of refraction in C, Al, Ti, and Pd plasmas and show many conditions over which the bound-electron contribution dominates the free electrons as we explore photon energies from the optical to 100 eV (12 nm) soft x rays. For decades measurement of the electron density in plasmas by interferometers has relied on the approximation that the index of refraction in a plasma is due solely to the free electrons and therefore is less than 1. Recent measurements of Al plasmas using x-ray laser interferometers observed fringes bending in the opposite direction than expected due to the bound-electron contribution causing the index of refraction to be larger than 1. During the next decade x-ray free-electron lasers and other sources will be available to probe a wider variety of plasmas at higher densities and shorter wavelengths, so understanding the index of refraction in plasmas is essential
Additional details
Identifiers
- DOI
- 10.1364/AO.44.007295;
Publishing Information
- Journal Title
- Applied Optics
- Journal Volume
- 44
- Journal Issue
- 34
- Journal Page Range
- p. 7295-7301
- ISSN
- 0003-6935
- CODEN
- APOPAI
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37083407
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- APPROXIMATIONS; ELECTRON DENSITY; ELECTRONS; EV RANGE 10-100; FREE ELECTRON LASERS; INTERFEROMETERS; INTERFEROMETRY; PLASMA; REFRACTIVE INDEX; SOFT X RADIATION; ULTRAVIOLET SPECTRA; X-RAY LASERS
- Descriptors DEC
- CALCULATION METHODS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ENERGY RANGE; EV RANGE; FERMIONS; IONIZING RADIATIONS; LASERS; LEPTONS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SPECTRA; X RADIATION
Optional Information
- Notes
- (c) 2005 Optical Society of America