Published May 1985
| Version v1
Journal article
Application of layered synthetic microstructures to high-temperature plasma diagnostics (invited)
Creators
- 1. Physics Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
Description
Layered synthetic microstructures (LSM's) are a new type of man-made x-ray diffracting element which can be applied to a broad variety of diagnostic applications. The ability to use the synthesis process to engineer the properties of the LSM allows the designer of x-ray diagnostics to construct many novel instruments. In this paper, we review the state of the art in LSM fabrication and will describe some unique spectrometers that have been designed and fielded to provide measurements which are unachievable with conventional designs. We have also begun an experiment to understand the properties of LSM's under intense heat loads. We will describe the experiments to date and our plans for further work in this area
Additional details
Publishing Information
- Journal Title
- Rev. Sci. Instrum.
- Journal Volume
- 56
- Journal Issue
- 5
- Series
- Rev. Sci. Instrum.
- Journal Page Range
- 791-795
- ISSN
- 0034-6748
- CODEN
- RSINA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17000481
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- FABRICATION; HEATING; LAYERS; MICROSTRUCTURE; PLASMA DIAGNOSTICS; SPECIFICATIONS; THIN FILMS; X RADIATION; X-RAY DIFFRACTION; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELECTROMAGNETIC RADIATION; FILMS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATIONS; SCATTERING; SPECTROMETERS; SPECTROSCOPY