Published August 21, 2011
| Version v1
Journal article
Background rejection capabilities of a Compton imaging telescope setup with a DSSD Ge planar detector and AGATA
- 1. Laboratorio de Radiaciones Ionizantes, Universidad de Salamanca (Spain)
- 2. IFIC Valencia, Valencia (Spain)
- 3. INFN sezione di Padova, Padova (Italy)
Description
In this work, we show the first Monte Carlo results about the performance of the Ge array which we propose for the DESPEC experiment at FAIR, when the background algorithm developed for AGATA is applied. The main objective of our study is to characterize the capabilities of the γ-spectroscopy system, made up of AGATA detectors in a semi-spherical distribution covering a 1π solid angle and a set of planar Ge detectors in a daisy configuration, to discriminate between γ sources placed at different locations.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2010.12.071Additional details
Identifiers
- DOI
- 10.1016/j.nima.2010.12.071;
- PII
- S0168-9002(10)02812-3;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 648
- Journal Issue
- Suppl.1
- Journal Page Range
- p. S131-S134
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 4. international conference on imaging techniques in subatomic physics, astrophysics, medicine, biology and industry
- Acronym
- NIMA
- Dates
- 8-11 Jun 2010
- Place
- Stockholm (Sweden)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43060071
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALGORITHMS; GAMMA SPECTROSCOPY; GE SEMICONDUCTOR DETECTORS; MONTE CARLO METHOD; PERFORMANCE; SPHERICAL CONFIGURATION; TELESCOPES
- Descriptors DEC
- CALCULATION METHODS; CONFIGURATION; MATHEMATICAL LOGIC; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.