Scanning electron microscope (SEM), focused ion beam (FIB), and transmission electron microscopy (TEM) for cultural heritage

Full text: Electron microscopy including SEM, FIB and TEM are important techniques for use in Cultural Heritage, Conservation Science and Archaeology. The scanning electron microscope can examine an object without any alteration or physical damage. Surface morphology at very high resolution and chemical composition are possible using this technique. If further information is required, the object can be prepared using the focused ion beam to create a cross section for TEM examination where the same information and more can be extracted at the sub-nanometre level. (author)