X-ray diamond detectors with energy resolution

Polycrystalline diamond detectors with energy resolving capability of the impinging beam were realized and tested by using a miniature pyroelectric x-ray pulse generator. Microstrip structures were defined by photolithography aimed to reduce parasitic capacitances and to perform characterization measurements in a sandwich configuration. Leakage currents as low as 20 pA at 500 V were measured on a 270 μm thick device. Pulse height distributions were carried out around Ta Lα (8.14 keV) and Cu Kα (8.05 keV) characteristic lines of the source. Energy resolution at 200 V was found equal to 9% with an increase to 11% at 500 V. When the bias was increased to the maximum voltage the sample shows an Ohmic behavior