Biological and material science applications of EUV and SXR nanoscale imaging systems based on double stream gas puff target laser plasma sources
Creators
- 1. Institute of Optoelectronics, Military University of Technology, Kaliskiego 2 Str., 00-908 Warsaw (Poland)
Description
In the last 30 years much effort was made in order to develop compact laser-produced plasma sources emitting short wavelength radiation, from the soft X-ray (SXR, λ = 0.1–10 nm), especially in the so-called "water window" (λ = 2.3–4.4 nm) and in the extreme ultraviolet (EUV, λ = 10–120 nm) spectral ranges. Investigations in the nanometer scale, employing short wavelengths, drive the need for developing table-top microscopes, to overpass the limitations imposed by large facilities, such as their high complexity, maintenance costs and the limited user access.
sp0010>In this paper we present our recent results related to nanoscale imaging using such table-top and desk-top EUV/SXR microscopes. Their construction is based on a double stream gas puff target laser plasma source. The double stream gas puff target EUV and SXR sources, coupled with Fresnel zone plates (FZPs) represent a suitable platform for microscopy experiments in transmission mode, employing SXR and EUV radiation. It represents a possible complementary technique to synchrotrons and free-electron laser facilities. The sources, which are very easy to be used by a single user, allow for efficient generation of plasma radiation with high SXR/EUV flux. Presented herein compact microscopes, based on that source, allow one to capture SXR and EUV images of various samples, with 50–60 nm half-pitch spatial resolution (corresponding to a Rayleigh resolution of 100–120 nm) and exposure time of the order of few seconds. Thus, herein, we would like to present our recent developments and progress in compact desk-top SXR/EUV microscopy employing laser plasma gas puff target sources, showing examples of acquired images and possible applications.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2017.01.035Additional details
Additional titles
- Augmented title (English)
- KEYWORDS: GAS PUFF TARGET;FRESNEL ZONE PLATES;EUV/SXR MICROSCOPY;IMAGING;NANOMETER RESOLUTION
Identifiers
- DOI
- 10.1016/j.nimb.2017.01.035;
- PII
- S0168583X17300502;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 411
- Journal Page Range
- p. 29-34
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 13. international school and symposium on synchrotron radiation in natural science
- Acronym
- ISSRNS 2016
- Dates
- 13-18 Jun 2016
- Place
- Ustron (Poland)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51066044
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- EXTREME ULTRAVIOLET RADIATION; FREE ELECTRON LASERS; IMAGES; LASER-PRODUCED PLASMA; MICROSCOPES; MICROSCOPY; NANOSTRUCTURES; SOFT X RADIATION; SPATIAL RESOLUTION; STREAMS
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; LASERS; PLASMA; RADIATIONS; RESOLUTION; RIVERS; SURFACE WATERS; ULTRAVIOLET RADIATION; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier B.V. All rights reserved.