Optical and electrical properties of semi-conducting calix[5,9]arene thin films with potential applications in organic electronics
Creators
- 1. Electronic Engineering Department, ISSAT Sousse, Université de Sousse, Cité Ettafala, 4003 Ibn Khaldoun Sousse (Tunisia)
- 2. Laboratoire de Physique et Chimie des Interfaces, Faculté des Sciences de Monastir, 5000 Monastir (Tunisia)
- 3. Université de Lyon - Laboratoire Hubert Curien - UMR CNRS 5516 - Université Jean Monnet, Départment Optique et Photonique, 18 rue Pr Benoit Lauras, Bat. F, F-42000, Saint-Etienne (France)
- 4. Université de Lyon, F-69361, Lyon, CNRS, UMR 5223, Ingénierie des Matériaux polymères, 43 Bd du 11 Novembre 1918, F-69622 Villeurbanne (France)
Description
Indium tin oxide (ITO) substrates have been functionalized by several substituted calix[n]arene (n = 5 or 9) derivatives using spin coating to fabricate organic diode devices. The effect of rim size and side substituents has been investigated by UV–visible absorption spectrophotometry. The energy band gaps of these calixarene derivative thin films have been found in the 1.166–1.450 eV range. The electrical properties of ITO/calix[n]arene/Al diodes have been studied by current–voltage measurement showing an ohmic behaviour at low voltage. The I(V) characteristics could be modelled by a space-charge-limited current (SCLC) mechanism at high applied bias voltage. The ac electrical transport of calix[5,9]arene derivatives has been studied over a wide range of bias voltage and frequency by impedance spectroscopy. The device had been accurately modelled, for a frequency between 100 Hz and 10 MHz, by a single parallel resistor and capacitor network in series with a resistance. A dielectric relaxation time in the ms range and a transport mechanism controlled by an exponential trap distribution were deduced from the fit of the experimental data. The evolution of electrical parameters with chemical structure (rim size and substituent) has been discussed. The conductivity σ(ω) evolution with frequency and bias voltage was studied for ITO/calix[n]arene/Al devices. The dc conductivity σdc for these devices has been determined. The ac conductivity σac showed a variation in angular frequency as A.ωs with a critical exponent s < 1 suggesting a hopping conduction mechanism at high frequency and a microscopic picture of the relaxation and hopping processes has been proposed
Availability note (English)
Available from http://dx.doi.org/10.1088/0268-1242/24/10/105007Additional details
Identifiers
- DOI
- 10.1088/0268-1242/24/10/105007;
- PII
- S0268-1242(09)05142-6;
Publishing Information
- Journal Title
- Semiconductor Science and Technology
- Journal Volume
- 24
- Journal Issue
- 10
- Journal Page Range
- [10 p.]
- ISSN
- 0268-1242
- CODEN
- SSTEET
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45011153
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION; CAPACITORS; DIELECTRIC MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; MHZ RANGE; RELAXATION TIME; SPECTROPHOTOMETRY; SUBSTRATES; THIN FILMS; TIN OXIDES
- Descriptors DEC
- CHALCOGENIDES; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; EQUIPMENT; FILMS; FREQUENCY RANGE; MATERIALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SORPTION; TIN COMPOUNDS