Fabrication of high sensitivity 3D nanoSQUIDs based on a focused ion beam sculpting technique
Creators
- 1. INRIM, Istituto Nazionale di Ricerca Metrologica, I-10135 Torino (Italy)
- 2. Institute of Applied Sciences and Intelligent Systems 'E. Caianiello' del Consiglio Nazionale delle Ricerche, I-80078 Pozzuoli (Napoli) (Italy)
Description
In this paper a nanofabrication process, based on a focused ion beam (FIB) nanosculpting technique, for high sensitivity three-dimensional nanoscale superconducting quantum interference devices (nanoSQUIDs) is reported. The crucial steps of the fabrication process are described, as are some peculiar features of the superconductor–normal metal–insulator–superconductor (SNIS) Josephson junctions, which may useful for applications in cryocooler systems. This fabrication procedure is employed to fabricate sandwich nanojunctions and high sensitivity nanoSQUIDs. Specifically, the superconductive nanosensors have a rectangular loop of 1 × 0.2–0.4 μ m2 interrupted by two square Nb/Al–AlO x /Nb SNIS Josephson junctions with side lengths of 0.3 μ m. The characterization of a typical nanoSQUID has been carried out and a spectral density of magnetic flux noise as low as 0.8 μ Φ0 Hz–1/2 has been measured. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-2048/29/9/094007Additional details
Identifiers
Publishing Information
- Journal Title
- Superconductor Science and Technology
- Journal Volume
- 29
- Journal Issue
- 9
- Journal Page Range
- [6 p.]
- ISSN
- 0953-2048
- CODEN
- SUSTEF
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50023505
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- FABRICATION; ION BEAMS; JOSEPHSON JUNCTIONS; MAGNETIC FLUX; NANOSTRUCTURES; SPECTRAL DENSITY; SQUID DEVICES; SUPERCONDUCTORS
- Descriptors DEC
- BEAMS; ELECTRONIC EQUIPMENT; EQUIPMENT; FLUXMETERS; FUNCTIONS; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; SPECTRAL FUNCTIONS; SUPERCONDUCTING DEVICES; SUPERCONDUCTING JUNCTIONS; TUNNEL JUNCTIONS