Published August 2005 | Version v1
Journal article

Metrology at the nano scale

  • 1. National Physical Laboratory, Teddington (United Kingdom)

Description

Progress in nanotechnology relies on ever more accurate measurements of quantities such as distance, force and current industry has long depended on accurate measurement. In the 19th century, for example, the performance of steam engines was seriously limited by inaccurately made components, a situation that was transformed by Henry Maudsley's screw micrometer calliper. And early in the 20th century, the development of telegraphy relied on improved standards of electrical resistance. Before this, each country had its own standards and crossborder communication was difficult. The same is true today of nanotechnology if it is to be fully exploited by industry. Principles of measurement that work well at the macroscopic level often become completely unworkable at the nanometre scale - about 100 nm and below. Imaging, for example, is not possible on this scale using optical microscopes, and it is virtually impossible to weigh a nanometre-scale object with any accuracy. In addition to needing more accurate measurements, nanotechnology also often requires a greater variety of measurements than conventional technology. For example, standard techniques used to make microchips generally need accurate length measurements, but the manufacture of electronics at the molecular scale requires magnetic, electrical, mechanical and chemical measurements as well. (U.K.)

Availability note (English)

Available online: http://www.physicsweb.org/

Additional details

Identifiers

Publishing Information

Journal Title
Physics World
Journal Volume
18
Journal Issue
8
Journal Page Range
p. vp.
ISSN
0953-8585

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36090885
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Is Lead record
Yes
Descriptors DEI
APPROPRIATE TECHNOLOGY; MEASURING METHODS; NANOSTRUCTURES; STANDARDS; TECHNOLOGY UTILIZATION