Published January 2021
| Version v1
Journal article
Space-charge effects in ionization beam profile monitors
Creators
- 1. Fermi National Accelerator Laboratory, PO Box 500, MS339, Batavia, IL, 60510 (United States)
Description
Ionization profile monitors (IPMs) are widely used in accelerators for non-destructive and fast diagnostics of high energy particle beams. At high beam intensities, the space-charge forces make the measured IPM profiles significantly different from those of the beams. We analyze dynamics of the secondaries in IPMs and develop an effective algorithm to reconstruct the beam sizes from the measured IPM profiles. Efficiency of the developed theory is illustrated in application to the Fermilab 8 GeV proton Booster IPMs.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2020.164744Additional details
Identifiers
- DOI
- 10.1016/j.nima.2020.164744;
- PII
- S0168900220311414;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 986
- Journal Page Range
- vp.
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54011969
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCELERATORS; ALGORITHMS; BEAM PROFILES; FERMILAB; GEV RANGE; IONIZATION; PARTICLE BEAMS; PROTONS; RADIATION MONITORS; SPACE CHARGE
- Descriptors DEC
- BARYONS; BEAMS; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; HADRONS; MATHEMATICAL LOGIC; MEASURING INSTRUMENTS; MONITORS; NATIONAL ORGANIZATIONS; NUCLEONS; US DOE; US ORGANIZATIONS
Optional Information
- Copyright
- Copyright (c) 2021 Published by Elsevier B.V.