Published February 2010
| Version v1
Book
Development of 'XRFET' dosimeters for integrated ionizing radiation measurements
- 1. Electronics Division, Bhabha Atomic Research Centre, Mumbai (India)
- 2. Electrical Engineering Department, Indian Institute of Technology Bombay, Mumbai (India)
Description
Radiation sensitive 'XRFET' dosimeters have been developed for integrated ionizing radiation measurements. The fabrication of these devices has been carried out by developing a 'radiation-soft' CMOS process using the CMOS foundry of SITAR, Bangalore. An overview of this R and D and the results showing the performance of dosimeters are presented in this paper. (author)
Additional details
Publishing Information
- Publisher
- Dept. of Atomic Energy
- Imprint Place
- Mumbai (India)
- ISBN
- 81-88513-33-4
- Imprint Title
- Proceedings of DAE-BRNS national symposium on nuclear instrumentation - 2010
- Imprint Pagination
- 679 p.
- Journal Page Range
- p. 277-280
Conference
- Title
- national symposium on nuclear instrumentation
- Acronym
- NSNI 2010
- Dates
- 24-26 Feb 2010
- Place
- Mumbai (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 41082256
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DOSEMETERS; GAMMA RADIATION; MOSFET; PERFORMANCE TESTING; RADIATION DOSES; SPECIFICATIONS
- Descriptors DEC
- DOSES; ELECTROMAGNETIC RADIATION; FIELD EFFECT TRANSISTORS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MOS TRANSISTORS; RADIATIONS; SEMICONDUCTOR DEVICES; TESTING; TRANSISTORS
Optional Information
- Notes
- 2 refs., 9 figs.