Millianalyser by x-ray fluorescence

Research on the possibility of mm-size nondestructive analysis was carried out by the fluorescent x-ray method. With 0.2 mm pin-hole slit, source x-rays from a Cu target diffraction tube were collimated to a spot smaller than 1 mm phi at a slide stage placed about 5 cm distant from the pin-hole slit. Resultant x-rays from a sample placed on the slide stage, which is excited by the collimated x-ray, were detected with a head-on-type 6 mm SSD, placed so that its 12.5 micron Be window was about 5 cm beneath the stage. X-ray intensities sufficient for analysis (500 to 5000 CPS) could be obtained for various metallic samples with up to 40 kV-10 mA excitation. This instrument proved to be useful for mm-size qualitative analysis in measurements of tiny samples. Furthermore, the possibility of distribution analysis is expected based on the result of an investigation on c.a. 0.1 percent Cr in LiNbO3, where the ratios of Cr-Kα intensity to scattered Cu-Kα intensity varied between 0.094 and 0.19, with deviations of less than 7.5 percent at five successive points located at 2 mm intervals along the direction of growth