A facile route to prepare ZnO super-hydrophobic surface with hierarchical structure
- 1. Ningbo Institute of Material Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201 (China)
- 2. Faculty of Science, Ningbo University, Ningbo 315211 (China)
Description
Zn oxide film with the special hierarchical structure, consisting of microspheres and nano-nets, has been successfully fabricated by a two-step solution approach on a sapphire substrate. The surface chemistry and morphological features were characterized by X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). X-ray diffraction pattern (XRD) shows that all diffraction peaks can be indexed to those of the hexagonal wurtzite phase of Zn oxide and no other phases were detected. Transmittance measurements show that the optical transmittance of the sample synthesized at 720 deg. C on the sapphire substrate is about 73% in the visible light wave band. The water repelling characteristics of the film were measured by the snapshots with a Hitachi camera, and the measurement shows the water has a contact angle (CA) of about 151.3 deg. as well as a small sliding angle (SA) of about 6o. The above measurements indicate that the Zn oxide film has the super-hydrophobic property.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchemphys.2009.05.033Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2009.05.033;
- PII
- S0254-0584(09)00297-1;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 117
- Journal Issue
- 1
- Journal Page Range
- p. 183-186
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43069606
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- FILMS; MICROSPHERES; NANOSTRUCTURES; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CORUNDUM; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SCATTERING; SPECTROSCOPY; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.