Fabrication and characterization of SiGe coaxial quantum wells on ordered Si nanopillars
- 1. State Key Laboratory of Surface Physics and Key Laboratory of Micro- and Nano-Photonic Structures (Ministry of Education) and Department of Physics, Fudan University, Shanghai 200433 (China)
Description
Controlled SiGe coaxial quantum wells (CQWs) on periodic Si(001) nanopillars in a large area are explored systematically. The periodic SiGe CQW nanopillars are fabricated by a combination of nanosphere lithography, metal assisted chemical etching and epitaxial growth. The period, the radius, the height, the composition and the thickness of the SiGe alloy layer can all be intentionally modified. Considerably enhanced photoluminescence (PL) from the SiGe CQW nanopillars is observed, which is composed of four peaks. Such PL features are explained by the coupling between the spontaneous emissions of the SiGe CQW and the Mie resonant modes of the nanopillars, which can be further improved by optimizing the structural parameters of the SiGe CQW and the nanopillars. Our results demonstrate a feasible route to obtaining controlled SiGe CQW nanopillars, which have potential applications in optoelectronic devices. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/25/5/055204Additional details
Identifiers
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 25
- Journal Issue
- 5
- Journal Page Range
- [6 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47046699
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ALLOYS; EPITAXY; ETCHING; FABRICATION; GERMANIUM SILICIDES; HEIGHT; LAYERS; METALS; OPTOELECTRONIC DEVICES; PERIODICITY; PHOTOLUMINESCENCE; QUANTUM WELLS; THICKNESS
- Descriptors DEC
- CRYSTAL GROWTH METHODS; DIMENSIONS; ELECTRONIC EQUIPMENT; ELEMENTS; EMISSION; EQUIPMENT; GERMANIUM COMPOUNDS; LUMINESCENCE; NANOSTRUCTURES; OPTICAL EQUIPMENT; PHOTON EMISSION; SILICIDES; SILICON COMPOUNDS; SURFACE FINISHING; TRANSDUCERS; VARIATIONS