Published July 28, 2010 | Version v1
Journal article

The origin of Bohm diffusion, investigated by a comparison of different modelling methods

  • 1. Research group PLASMANT, Department of Chemistry, University of Antwerp, Universiteitsplein 1, 2610 Antwerp (Belgium)
  • 2. Research group DRAFT, Department of Solid State Sciences, Ghent University, Krijgslaan 281 (S1), B-9000 Gent (Belgium)

Description

'Bohm diffusion' causes the electrons to diffuse perpendicularly to the magnetic field lines. However, its origin is not yet completely understood: low and high frequency electric field fluctuations are both named to cause Bohm diffusion. The importance of including this process in a Monte Carlo (MC) model is demonstrated by comparing calculated ionization rates with particle-in-cell/Monte Carlo collisions (PIC/MCC) simulations. A good agreement is found with a Bohm diffusion parameter of 0.05, which corresponds well to experiments. Since the PIC/MCC method accounts for fast electric field fluctuations, we conclude that Bohm diffusion is caused by fast electric field phenomena. (fast track communication)

Availability note (English)

Available from http://dx.doi.org/10.1088/0022-3727/43/29/292001

Additional details

Identifiers

DOI
10.1088/0022-3727/43/29/292001;
PII
S0022-3727(10)57108-0;

Publishing Information

Journal Title
Journal of Physics. D, Applied Physics
Journal Volume
43
Journal Issue
29
Journal Page Range
[5 p.]
ISSN
0022-3727
CODEN
JPAPBE

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42059652
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
DIFFUSION; ELECTRIC FIELDS; ELECTRONS; FLUCTUATIONS; IONIZATION; MAGNETIC FIELDS; MONTE CARLO METHOD; SIMULATION
Descriptors DEC
CALCULATION METHODS; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; VARIATIONS