Published March 5, 2014
| Version v1
Journal article
Wafer bonding solution to epitaxial graphene–silicon integration
Creators
- 1. School of Physics, Georgia Institute of Technology, Atlanta GA, 30332 (United States)
Description
A new strategy for the integration of graphene electronics with silicon complementary metal–oxide–semiconductor (Si-CMOS) technology is demonstrated that requires neither graphene transfer nor patterning. Inspired by silicon-on-insulator and three-dimensional device hyper-integration techniques, a thin monocrystalline silicon layer ready for CMOS processing is bonded to epitaxial graphene (EG) on SiC. The parallel Si and graphene electronic platforms are interconnected by metal vias. In this method, EG is grown prior to bonding so that the process is compatible with EG high temperature growth and preserves graphene integrity and nano-structuring. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0022-3727/47/9/094001Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 47
- Journal Issue
- 9
- Journal Page Range
- [8 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46055318
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BONDING; EPITAXY; GRAPHENE; LAYERS; MATHEMATICAL SOLUTIONS; METALS; NANOSTRUCTURES; OXIDES; SEMICONDUCTOR MATERIALS; SILICON; SILICON CARBIDES; THREE-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- CARBIDES; CARBON; CARBON COMPOUNDS; CHALCOGENIDES; CRYSTAL GROWTH METHODS; ELEMENTS; FABRICATION; JOINING; MATERIALS; NONMETALS; OXYGEN COMPOUNDS; SEMIMETALS; SILICON COMPOUNDS