Published March 5, 2014 | Version v1
Journal article

Wafer bonding solution to epitaxial graphene–silicon integration

  • 1. School of Physics, Georgia Institute of Technology, Atlanta GA, 30332 (United States)

Description

A new strategy for the integration of graphene electronics with silicon complementary metal–oxide–semiconductor (Si-CMOS) technology is demonstrated that requires neither graphene transfer nor patterning. Inspired by silicon-on-insulator and three-dimensional device hyper-integration techniques, a thin monocrystalline silicon layer ready for CMOS processing is bonded to epitaxial graphene (EG) on SiC. The parallel Si and graphene electronic platforms are interconnected by metal vias. In this method, EG is grown prior to bonding so that the process is compatible with EG high temperature growth and preserves graphene integrity and nano-structuring. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0022-3727/47/9/094001

Additional details

Publishing Information

Journal Title
Journal of Physics. D, Applied Physics
Journal Volume
47
Journal Issue
9
Journal Page Range
[8 p.]
ISSN
0022-3727
CODEN
JPAPBE