Published June 2009
| Version v1
Journal article
Projection x-ray microscope, until now and in the future
- 1. TOHKEN Co., Ltd., X-Ray R and D Dept., Chofu, Tokyo (Japan)
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Hihakai Kensa
- Journal Volume
- 58
- Journal Issue
- 6
- Journal Page Range
- p. 223-226
- ISSN
- 0367-5866
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 41000765
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- BEAM INJECTION; CATHODES; ELECTRON GUNS; ELECTRON SOURCES; FIELD EMISSION; LENSES; MICROSCOPES; SPATIAL RESOLUTION; X RADIATION; X-RAY SOURCES
- Descriptors DEC
- ELECTRODES; ELECTROMAGNETIC RADIATION; EMISSION; IONIZING RADIATIONS; PARTICLE SOURCES; RADIATION SOURCES; RADIATIONS; RESOLUTION
Optional Information
- Notes
- 19 refs., 7 figs.