Published July 2010
| Version v1
Journal article
Entanglement generation in planar Penning traps
- 1. IPFN, Instituto Superior Tecnico, P-1049-001 Lisboa (Portugal)
- 2. CLOQ, Faculdade de Cie circumflex ncias, Universidade do Porto, P-4169-007 Porto (Portugal)
- 3. CFIF, Instituto Superior Tecnico, P-1049-001 Lisboa (Portugal)
Description
We investigate the generation of entanglement between the axial degrees of freedom of electrons confined in separated locations in planar Penning traps. We show that there are two different sources of entanglement: one is related with the mechanism of switching on and off the electrical coupling between the two electrons, and the other is due to the two-quanta-transition term of the coupling interaction. We show that the degree of entanglement can be controlled by adjusting the strength of the coupling between the traps and the time of interaction. We show that the coupled electrons behave as a temporal active interferometer.
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. A
- Journal Volume
- 82
- Journal Issue
- 1
- Journal Page Range
- p. 012324-012324.8
- ISSN
- 1050-2947
- CODEN
- PLRAAN
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42036169
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- COUPLING; DEGREES OF FREEDOM; ELECTRONS; QUANTUM ENTANGLEMENT; QUANTUM MECHANICS; QUANTUM STATES; TRAPS
- Descriptors DEC
- ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MECHANICS
Optional Information
- Notes
- (c) 2010 The American Physical Society