Published July 2010 | Version v1
Journal article

Entanglement generation in planar Penning traps

  • 1. IPFN, Instituto Superior Tecnico, P-1049-001 Lisboa (Portugal)
  • 2. CLOQ, Faculdade de Cie circumflex ncias, Universidade do Porto, P-4169-007 Porto (Portugal)
  • 3. CFIF, Instituto Superior Tecnico, P-1049-001 Lisboa (Portugal)

Description

We investigate the generation of entanglement between the axial degrees of freedom of electrons confined in separated locations in planar Penning traps. We show that there are two different sources of entanglement: one is related with the mechanism of switching on and off the electrical coupling between the two electrons, and the other is due to the two-quanta-transition term of the coupling interaction. We show that the degree of entanglement can be controlled by adjusting the strength of the coupling between the traps and the time of interaction. We show that the coupled electrons behave as a temporal active interferometer.

Additional details

Identifiers

Publishing Information

Journal Title
Physical Review. A
Journal Volume
82
Journal Issue
1
Journal Page Range
p. 012324-012324.8
ISSN
1050-2947
CODEN
PLRAAN

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42036169
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S74: ATOMIC AND MOLECULAR PHYSICS;
Descriptors DEI
COUPLING; DEGREES OF FREEDOM; ELECTRONS; QUANTUM ENTANGLEMENT; QUANTUM MECHANICS; QUANTUM STATES; TRAPS
Descriptors DEC
ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MECHANICS

Optional Information

Notes
(c) 2010 The American Physical Society