Published March 1982 | Version v1
Journal article Metadata-only

X-ray scattering by thin real silicon crystals

Creators

  • 1. AN Ukrainskoj SSR, Kiev. Inst. Poluprovodnikov

Description

no abstract available

Additional details

Additional titles

Original title (Russian)
Рассеяние рентгеновских лучей тонкими реальными кристаллами кремния

Publishing Information

Journal Title
Fiz. Tverd. Tela
Journal Volume
24
Journal Issue
3
Series
Fiz. Tverd. Tela.
Journal Page Range
950-952
ISSN
0367-3294

INIS

Country of Publication
Russian Federation
Country of Input or Organization
USSR
INIS RN
14740698
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
No Abstract
Descriptors DEI
ANNEALING; BRAGG REFLECTION; CRYSTALS; DISLOCATIONS; SAMPLE PREPARATION; SILICON; SOLID CLUSTERS; THICKNESS; TIME DEPENDENCE
Descriptors DEC
CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIMENSIONS; ELEMENTS; HEAT TREATMENTS; LINE DEFECTS; REFLECTION; SEMIMETALS

Optional Information

Notes
Short note. For English translation see the journal Soviet Physics - Solid State (USA).