Published October 2007 | Version v1
Journal article

The hardness of silicon and germanium

  • 1. Gordon Laboratory, Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ (United Kingdom)

Description

It is generally accepted that the hardness of silicon and germanium at low temperature is limited by a phase transformation under the indenter, as the measured hardness is equal to the transformation pressure. However, observations of the deformation under indents using transmission electron microscopy indicate that, in addition to the phase transformation, there is also plastic flow both in the transformed region and outside it. An analysis based on the spherical cavity model for indentation was developed to quantify the effect of a phase transformation on the measured hardness. This predicts that plastic deformation will extend beyond the transformed zone when the transformation pressure is greater than two-thirds of the yield stress. The analysis also predicts that the hardness can only be approximately equal to the transformation pressure if the yield strength of the transformed material is low, consistent with the experimental observations of substantial plastic deformation of the transformed phase, as well as with estimates of its lattice resistance

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2007.07.036

Additional details

Identifiers

DOI
10.1016/j.actamat.2007.07.036;
PII
S1359-6454(07)00513-7;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
55
Journal Issue
18
Journal Page Range
p. 6307-6315
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39047805
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
GERMANIUM; HARDNESS; PHASE TRANSFORMATIONS; PLASTICITY; SILICON; STRESSES; TRANSMISSION ELECTRON MICROSCOPY; YIELD STRENGTH
Descriptors DEC
ELECTRON MICROSCOPY; ELEMENTS; MECHANICAL PROPERTIES; METALS; MICROSCOPY; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.