FePtC magnetic recording media with (200) textured MoC intermediate layer
- 1. Department of Materials Science and Engineering, National Chung Hsing University, Taichung 402, Taiwan (China)
Description
The FePt films with thickness of 4–10 nm were deposited on MoC/CrRu/glass at 425 °C by using magnetron sputtering. The Mo40C60 target was used to form the MoC and C two phases after deposition. The MoC intermediate layer was epitaxially grown on the (200) textured CrRu seed layer at 425 °C and the MoC (200) diffraction peak was not clearly indexed below 10 nm but observed at 25 nm. Finally, the FePt film was prepared on (200) textured MoC at 425 °C and shown the strong (001) texture. Perpendicular anisotropy of 1.7 × 107 erg/cm3 and out-of-plane coercivity of 7.5 kOe has been demonstrated in 10 nm thick FePt film. From microstructure, the FePt grains were distributed in- or between-islands like structure and further separated by excess carbon from MoC intermediate layer. Thinner FePt film was more separated by excess carbon and shown higher coercivity
Additional details
Identifiers
- DOI
- 10.1063/1.4906324;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 117
- Journal Issue
- 17
- Journal Page Range
- vp.
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46115873
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANISOTROPY; CHROMIUM; COERCIVE FORCE; CRYSTAL STRUCTURE; DEPOSITION; DIFFRACTION; EPITAXY; INTERFACES; INTERMETALLIC COMPOUNDS; IRON; LAYERS; MICROSTRUCTURE; MOLYBDENUM CARBIDES; PLATINUM; RUTHENIUM; SPUTTERING; TEXTURE; THIN FILMS
- Descriptors DEC
- ALLOYS; CARBIDES; CARBON COMPOUNDS; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; ELEMENTS; FILMS; METALS; MOLYBDENUM COMPOUNDS; PLATINUM METALS; REFRACTORY METAL COMPOUNDS; REFRACTORY METALS; SCATTERING; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC